I've had quite a slump after the disappointing results of my last literature search but started getting things together again two weeks ago. Since then I've had 3 or 4 brief sessions of reading but mostly irrelevant until today's reading of the article by Brian Huston: "The effects of design pattern application on metric scores" this morning. This has given me a big boost in ideas on metrics. Some are: Lines of Code (LOC), Duplicated Lines per 'copy', Average Depth-in-Tree (DIT), Number of Children (NOC), Number of Methods (NOM), Coupling Factor (COF), Lack of Cohesion (LCOM).
Yesterday, I reread a few of the articles I've read before. In the previous session, I read one of Prechelt's experiments on whether design pattern documentation improves maintenance of code.
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